01.040.31 : Electronics (Vocabularies)

DIN 44472:1980-07

DIN 44472:1980-07

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Integrated interface circuits; terminology, analogue to digital converter

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DIN 45165-2:1981-06

DIN 45165-2:1981-06

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Filter with piezoelectric vibrators; monolithic Filter, terms

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DIN 45100:1981-07

DIN 45100:1981-07

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Crystal units; terms

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DIN 45170:1981-08

DIN 45170:1981-08

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Temperature control devices for crystal units; terms

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DIN IEC 47(CO)797:1982-04

DIN IEC 47(CO)797:1982-04

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Analogue integrated circuits; terms, definitions and letter symbols for integrated circuit regulators

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DIN 41848-1:1983-07

DIN 41848-1:1983-07

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Integrated film circuits; terms and definitions

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DIN IEC 47(CO)894:1983-08

DIN IEC 47(CO)894:1983-08

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Amendments to the generic specification for semiconductor devices and integrated circuits; sampling requirements for small lots

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DIN 45174-1:1985-01

DIN 45174-1:1985-01

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Quartz crystal controlled oscillators; terms and definitions

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DIN 45174-1 Beiblatt 1:1985-01

DIN 45174-1 Beiblatt 1:1985-01

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Quartz crystal controlled oscillators; terms and definitions, explanations

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NF C01-541 (08/1992)

NF C01-541 (08/1992)

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Vocabulaire électrotechnique - Chapitre 541 : circuits imprimés

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IEC 60050-702:1992/AMD1:2016

IEC 60050-702:1992/AMD1:2016

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IEC 60050-702:1992/AMD1:2016 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices

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DIN IEC 60235-1:1978-09

DIN IEC 60235-1:1978-09

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Measurement of the Electrical Properties of Microwave Tubes; Part 1: Terminologie

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ASTM E2444-11

ASTM E2444-11

Superseded Historical

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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ASTM E2444-11e1

ASTM E2444-11e1

Superseded Historical

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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ASTM F83-71(2013)

ASTM F83-71(2013)

Superseded Historical

Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters

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