Standard Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers (Withdrawn 2003)
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Exigences de sécurité pour appareils électriques de mesurage, de régulation et de laboratoire - Partie 2-020 : Exigences particulières pour centrifugeuses de laboratoire
€113.50
Standard Test Method for Determining Interlaminar Resistance of Insulating Coatings Using Two Adjacent Test Surfaces
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
IEC 61028:1990 Electrical measuring instruments - X-Y recorders
€244.00
IEC 60746-5:1992 Expression of performance of electrochemical analyzers - Part 5: Oxidation-reduction potential or redox potential
€93.00
IEC 60068-2-7:1983/AMD1:1986 Amendment 1 - Basic environmental testing procedures - Part 2-7: Tests - Test Ga and guidance: Acceleration, steady state
€12.00
IEC 61028:1990/AMD1:1995 Amendment 1 - Electrical measuring instruments - X-Y recorders
IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
€46.00
IEC 61028:1990/AMD2:1997 Amendment 2 - Electrical measuring instruments - X-Y recorders
IEC 60270:2000 High-voltage test techniques - Partial discharge measurements
€342.00
IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
€302.00
IEC 60270:2000/COR1:2001 Corrigendum 1 - High-voltage test techniques - Partial discharge measurements
€0.00
IEC 60052:2002 Voltage measurement by means of standard air gaps
IEC 60112:2003 Method for the determination of the proof and the comparative tracking indices of solid insulating materials
€133.00
