Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
This product is not for sale, please contact us for more information
Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
Standard Specification for High-Strength, High-Conductivity Copper-Alloy Wire for Electronic Application
Standard Test Method for Thermal Endurance of Varnished Fibrous- or Film-Wrapped Magnet Wire
Standard Specification for Aluminum-Coated Steel Wire Strand
Standard Test Methods for Film-Insulated Magnet Wire
Standard Test Methods for Fibrous-Insulated Magnet Wire
Standard Specification for Concentric-Lay-Stranded Aluminum Conductors, Coated Steel Supported (ACSS)
Standard Specification for Shaped Wire Compact Concentric-Lay-Stranded Aluminum Conductors, Coated-Steel Supported (ACSS/TW)
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023)
Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding (Withdrawn 2024)
Standard Specification for Hard-Drawn Copper Wire
€65.00
Standard Specification for Compressed Round Stranded Copper Conductors, Hard, Medium-Hard, or Soft Using Single Input Wire Construction
Standard Specification for Copper-Clad Steel Electrical Conductor for CATV Drop Wire
Standard Specification for High Performance Tin-Coated Annealed Copper Wire Intended for Electrical and Electronic Application for Solderability
