31.200 : Integrated circuits. Microelectronics

DIN IEC 61967-3:2003-12

DIN IEC 61967-3:2003-12

Withdrawn Most Recent

Integrated circuits - Measurement of electromagnetic emissions; 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method (IEC 47A/674/CD:2003)

€105.42

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DIN IEC 61967-2:2003-12

DIN IEC 61967-2:2003-12

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM-cell method (IEC 47A/673/CD:2003)

€105.42

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DIN EN 61967-4/A1:2004-05

DIN EN 61967-4/A1:2004-05

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method (IEC 47A/693/CDV:2004); German version EN 61967-4:2002/prA1:2004

€48.79

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DIN IEC 62258-3:2004-06

DIN IEC 62258-3:2004-06

Superseded Historical

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC 47/1750/CD:2004)

€140.00

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DIN IEC 62404:2005-02

DIN IEC 62404:2005-02

Withdrawn Most Recent

Integrated Circuits - I/0 Interface Model for Integrated Circuits (IMIC) (IEC 47A/704/CD:2004)

€162.06

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DIN IEC 61967-6/A1:2005-06

DIN IEC 61967-6/A1:2005-06

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic Probe method (IEC 47A/720/CD:2005)

€84.58

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DIN IEC 62258-6:2005-07

DIN IEC 62258-6:2005-07

Superseded Historical

Semiconductor die products - Part 6: Requirements for information concerning thermal simulation (IEC 47/1808/CD:2005)

€63.27

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DIN IEC 62258-5:2005-07

DIN IEC 62258-5:2005-07

Superseded Historical

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation (IEC 47/1807/CD:2005)

€69.91

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DIN EN 62258-2:2005-12

DIN EN 62258-2:2005-12

Superseded Historical

Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2005); German version EN 62258-2:2005, text in English.

€157.10

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DIN IEC 62433:2005-12

DIN IEC 62433:2005-12

Superseded Historical

Models of Integrated Circuits for EMI behavioural simulation (IEC 47A/726/CD:2005)

€150.65

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DIN IEC 62215-2:2005-12

DIN IEC 62215-2:2005-12

Withdrawn Most Recent

Integrated circuits - Measurement of impulse immunity - Part 2: Fast Impulse Injection method (IEC 47A/730/CD:2005)

€105.42

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DIN EN 62258-1:2006-04

DIN EN 62258-1:2006-04

Superseded Historical

Semiconductor die products - Part 1: Requirements for procurement and use (IEC 62258-1:2005); German version EN 62258-1:2005.

€122.34

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DIN IEC 60747-16-2:2006-06

DIN IEC 60747-16-2:2006-06

Withdrawn Most Recent

Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers (IEC 60747-16-2:2001 + IEC 47E/296/CD:2006)

€111.40

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DIN IEC 62132-2:2006-08

DIN IEC 62132-2:2006-08

Superseded Historical

Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)

€98.32

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DIN IEC 60748-2-20:2006-12

DIN IEC 60748-2-20:2006-12

Withdrawn Most Recent

Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits (IEC 47A/755/CD:2006)

€98.32

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