Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz General conditions and definitions
€281.00
Semiconductor devices. Discrete devices Microwave diodes and transistors. field effect Blank detail specification BDS for microwave field-effect transistors
€201.00
Identification cards. Contactless integrated circuit(s) Proximity cards Physical characteristics
€172.00
Semiconductor devices. Integrated circuits. Digital integrated circuits Family specification. Low voltage
Product package labels for electronic components using bar code and two-dimensional symbologies
€370.00
Integrated circuits. Measurement of electromagnetic emissions, 150 kHzto 1 GHz radiated emissions. Surface scan method
Delay and power calculation standards Pre-layout delay specification for CMOS ASIC libraries
€329.00
Semiconductor devices. Integrated circuits General
Advanced library format (ALF) describing integrated circuit (IC) technology, cells and blocks
€421.00
Integrated circuits. EMC evaluation of CAN transceivers
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz General conditions and definitions
EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions (ICEM-CE)
EMC IC modelling General framework
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
€390.00
Internal micrometers
