37.020 : Optical equipment

ASTM E2642-09(2015)

ASTM E2642-09(2015)

Superseded Historical

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

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ASTM F1863-16

ASTM F1863-16

Superseded Historical

Standard Test Method for Measuring the Night Vision Goggle-Weighted Transmissivity of Transparent Parts

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ASTM E766-14e1

ASTM E766-14e1

Superseded Historical

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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ASTM E2228-18

ASTM E2228-18

Superseded Historical

Standard Guide for Microscopical Examination of Textile Fibers

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ASTM C1661-13

ASTM C1661-13

Superseded Historical

Standard Guide for Viewing Systems for Remotely Operated Facilities

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ASTM E766-14

ASTM E766-14

Superseded Historical

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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ASTM E1791-96(2021)

ASTM E1791-96(2021)

Active Most Recent

Standard Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry

€58.00

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ASTM E2642-09(2021)

ASTM E2642-09(2021)

Active Most Recent

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

€65.00

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ASTM E211-82(2022)

ASTM E211-82(2022)

Active Most Recent

Standard Specification for Cover Glasses and Glass Slides for Use in Microscopy

€58.00

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ASTM E2228-22

ASTM E2228-22

Superseded Historical

Standard Guide for Microscopical Examination of Textile Fibers

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ASTM E2228-23a

ASTM E2228-23a

Active Most Recent

Standard Guide for Microscopical Examination of Textile Fibers

€72.00

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ASTM E766-98(2008)e1

ASTM E766-98(2008)e1

Superseded Historical

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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ASTM E2642-08

ASTM E2642-08

Superseded Historical

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

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ASTM E2642-09

ASTM E2642-09

Superseded Historical

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

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ASTM E986-04(2010)

ASTM E986-04(2010)

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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