37.040.20 : Photographic paper, films and plates. Cartridges

ASTM E2245-11

ASTM E2245-11

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2244-11

ASTM E2244-11

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2246-11

ASTM E2246-11

Superseded Historical

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2244-11e1

ASTM E2244-11e1

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2245-11e1

ASTM E2245-11e1

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2246-11e1

ASTM E2246-11e1

Superseded Historical

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E1735-19

ASTM E1735-19

Superseded Historical

Standard Practice for Determining Relative Image Quality Response of Industrial Radiographic Imaging Systems from 4 to 25 MeV

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ASTM E2244-11(2018)

ASTM E2244-11(2018)

Withdrawn Most Recent

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)

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ASTM E2245-11(2018)

ASTM E2245-11(2018)

Withdrawn Most Recent

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)

This product is not for sale, please contact us for more information

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ASTM E2246-11(2018)

ASTM E2246-11(2018)

Withdrawn Most Recent

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023)

This product is not for sale, please contact us for more information

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ASTM E2244-05

ASTM E2244-05

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2246-05

ASTM E2246-05

Superseded Historical

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2245-05

ASTM E2245-05

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E1735-07

ASTM E1735-07

Superseded Historical

Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeV

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ASTM E2244-02

ASTM E2244-02

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

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