Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods
€56.64
Chemical analysis of nitride bonded silicon carbide refractories - Part 1 : chemical methods
€73.30
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials - Analyse chimique des surfaces
€70.75
Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials - Analyse chimique des surfaces
€64.01
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry - Analyse chimique des surfaces
Surface chemical analysis - Handling of specimens prior to analysis - Analyse chimique des surfaces
€62.00
Gas analysis - Determination of the water dew point of natural gas - Cooled surface condensation hygrometers - Analyse des gaz
€40.69
Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction - Analyse chimique des surfaces
Gas analysis - Preparation of calibration gas mixtures using dynamic volumetric methods - Part 11 : electrochemical generation - Analyse des gaz
€82.00
Plastics - Polyamides - Determination of epsilonn-caprolactam and omega-laurolactam by gas chromatography - Plastiques
€78.00
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis - Analyse chimique des surfaces
€84.02
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials - Analyse chimique des surfaces
Expression of performance of gas analysers - Part 1 : general
€107.86
Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) - Analyse chimique des surfaces
€51.24
Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS) - Analyse chimique des surfaces
