71.040.40 : Chemical analysis

PD CEN/TR 17674:2021

PD CEN/TR 17674:2021

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Bio-based products. Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes. Overview of relevant existing applications

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BS ISO 19318:2021

BS ISO 19318:2021

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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

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BS ISO 14707:2021

BS ISO 14707:2021

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Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

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PD ISO/TR 15969:2021

PD ISO/TR 15969:2021

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Surface chemical analysis. Depth profiling. Measurement of sputtered depth

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BS ISO 18115-1:2023

BS ISO 18115-1:2023

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Surface chemical analysis. Vocabulary General terms and used in spectroscopy

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21/30433862 DC:2021

21/30433862 DC:2021

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BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

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BS EN 50436-4:2022

BS EN 50436-4:2022

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Alcohol interlocks. Test methods and performance requirements Connection digital interface between the alcohol interlock vehicle

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22/30439290 DC:2022

22/30439290 DC:2022

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BS ISO 6142-2. Gas analysis. Preparation of calibration gas mixtures Part 2. Gravimetric method for Class II

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BS ISO 6142-2:2024

BS ISO 6142-2:2024

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Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class II

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BS ISO 18115-2:2021

BS ISO 18115-2:2021

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Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy

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BS ISO 14606:2022

BS ISO 14606:2022

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Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

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BS ISO 5861:2024

BS ISO 5861:2024

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Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Ka XPS instruments

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BS ISO 17109:2022

BS ISO 17109:2022

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Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin films

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22/30444882 DC:2022

22/30444882 DC:2022

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BS EN 17813. Environmental matrices. Halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography detection and complementary determination methods

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BS EN 17813:2023

BS EN 17813:2023

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Environmental solid matrices. Determination of halogens and sulfur by oxidative pyrohydrolytic combustion followed by ion chromatography

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