Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
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Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
€75.00
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis
€178.00
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
€113.00
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction
Surface chemical analysis — Secondary-ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta-layer reference materials
€49.00
Surface chemical analysis — Information format for static secondary-ion mass spectrometry
Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
Surface chemical analysis — Depth profiling — Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
Gas analysis — Preparation of calibration gas mixtures using dynamic volumetric methods
€152.00
Gas analysis — Investigation and treatment of analytical bias
Surface chemical analysis — Auger electron spectroscopy — Repeatability and constancy of intensity scale
