Fume cupboards - Part 5 : recommendations for installation and maintenance
€176.67
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031 : safety requirements for hand-held probe assemblies for electrical measurement and test
€91.00
Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 % to 45 % of ZrO2 (alternative to the X-ray fluorescence method) - Part 2 : Wet chemical analysis - Analyse chimique des matériaux réfractaires contenant de l'alumine, de la zircone et de la silice
€70.75
Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 % to 45 % of ZrO2 (alternative to the X-ray fluorescence method) - Part 3 : flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP-AES) - Analyse chimique des matériaux réfractaires contenant de l'alumine, de la zircone et de la silice
Class 2 electronic breath tester - Estimation of the alcohol impregnation by analysis of expelled air - Specifications and test methods - Éthylotest électronique de classe 2
€46.33
Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors - Analyse par microfaisceaux
€58.62
Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods
€56.64
Chemical analysis of nitride bonded silicon carbide refractories - Part 1 : chemical methods
€73.30
Breath alcohol test devices other than single use devices - Requirements and test methods - Ethylotests, autres que les dispositifs à usage unique
€44.67
Emergency safety showers - Part 4 : non plumbed-in eyewash units
€46.50
Emergency safety showers - Part 3 : non plumbed-in body showers
€44.97
Laboratory glassware - Single-volume pipettes - Verrerie de laboratoire
€50.67
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials - Analyse chimique des surfaces
Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials - Analyse chimique des surfaces
€64.01
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry - Analyse chimique des surfaces
