71.040 : Analytical chemistry

71.040.01

Analytical chemistry in general

71.040.10

Chemical laboratories. Laboratory equipment

71.040.20

Laboratory ware and related apparatus

71.040.30

Chemical reagents

71.040.40

Chemical analysis

71.040.50

Physicochemical methods of analysis

71.040.99

Other standards related to analytical chemistry
DIN IEC 65D(Sec)10:1995-01

DIN IEC 65D(Sec)10:1995-01

Superseded Historical

Draft IEC 61207-3: Expression of performance of gas analysers - Part 3: Paramagnetic oxygen analysers (IEC 65D(Sec)10:1994)

€98.32

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BS 5202-7:1990

BS 5202-7:1990

Withdrawn Most Recent

Methods for chemical analysis of tobacco and products Determination alkaloids in smoke condensate cigarettes (spectrometric method)

€172.00

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BS 3762-3-3.4:1991

BS 3762-3-3.4:1991

Superseded Historical

Analysis of formulated detergents Quantitative test methods. Method for determination lower molecular mass cationic-active matter content

€172.00

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BS 3762-3-3.26:1989

BS 3762-3-3.26:1989

Superseded Historical

Analysis of formulated detergents Quantitative test methods Method for determination high molecular mass cationic-active matter content

€99.00

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BS IEC 61831:1999

BS IEC 61831:1999

Superseded Historical

On-line analyser systems. Guide to design and installation

€421.00

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BS IEC 61832:1999

BS IEC 61832:1999

Superseded Historical

Analyser systems. Guide to technical enquiry and bid evaluation

€329.00

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BS ISO 17560:2002

BS ISO 17560:2002

Superseded Historical

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon

€201.00

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BS EN ISO 4796-1:2001

BS EN ISO 4796-1:2001

Superseded Historical

Laboratory glassware. Bottles Screw-neck bottles

€172.00

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BS ISO 14237:2000

BS ISO 14237:2000

Superseded Historical

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

€281.00

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BS EN 60249-2-1:1994

BS EN 60249-2-1:1994

Superseded Historical

Specifications Specification for phenolic cellulose paper copper-clad laminated sheet, high electrical quality

€201.00

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BS ISO 17973:2002

BS ISO 17973:2002

Withdrawn Most Recent

Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

€201.00

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BS ISO 14707:2000

BS ISO 14707:2000

Superseded Historical

Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

€201.00

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BS ISO 14606:2000

BS ISO 14606:2000

Withdrawn Most Recent

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

€281.00

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BS ISO 15472:2001

BS ISO 15472:2001

Superseded Historical

Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales

€329.00

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BS ISO 14706:2000

BS ISO 14706:2000

Superseded Historical

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

€281.00

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