Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
€370.00
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
€201.00
Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
€281.00
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Animal feeding stuffs: Methods of sampling and analysis. Recommendations for the organization and evaluation of collaborative studies for multi-analyte methods of analysis
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
€172.00
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
€329.00
Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I
Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
Determination of certain substances in electrotechnical products Hexavalent chromium. hexavalent chromium (Cr(VI)) polymers and electronics by the colorimetric method
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
Bio-based products. Use of stable isotope ratios of Carbon, Hydrogen, Oxygen and Nitrogen as tools for verification of the origin of bio-based feedstock and characteristics of production processes. Overview of relevant existing applications
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
