IEC 62047-10:2011/COR1:2012 Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
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IEC 62047-13:2012 Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures
€93.00
IEC 62047-14:2012 Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
€133.00
IEC 60601-2-19:2009/COR1:2012 Corrigendum 1 - Medical electrical equipment - Part 2-19: Particular requirements for the basic safety and essential performance of infant incubators
IEC 60601-2-20:2009/COR1:2012 Corrigendum 1 - Medical electrical equipment - Part 2-20: Particular requirements for the basic safety and essential performance of infant transport incubators
IEC 60601-2-33:2010/COR1:2012 Corrigendum 1 - Medical electrical equipment - Part 2-33: Particular requirements for the basic safety and essential performance of magnetic resonance equipment for medical diagnosis
IEC 80601-2-35:2009/COR1:2012 Corrigendum 1 - Medical electrical equipment - Part 2-35: Particular requirements for the basic safety and essential performance of heating devices using blankets, pads or mattresses and intended for heating in medical use
IEC 61000-4-15:2010/COR1:2012 Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications
IEC 61800-3:2004+AMD1:2011 (Consolidated version) Adjustable speed electrical power drive systems - Part 3: EMC requirements and specific test methods
€957.00
IEC 61000-4-25:2001/AMD1:2012 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-25: Testing and measurement techniques - HEMP immunity test methods for equipment and systems
€23.00
IEC 62047-9:2011/COR1:2012 Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
IEC 62047-5:2011/COR1:2012 Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
IEC 60811-100:2012 Electric and optical fibre cables - Test methods for non-metallic materials - Part 100: General
€46.00
IEC 60811-203:2012 Electric and optical fibre cables - Test methods for non-metallic materials - Part 203: General tests - Measurement of overall dimensions
IEC 60811-301:2012 Electric and optical fibre cables - Test methods for non-metallic materials - Part 301: Electrical tests - Measurement of the permittivity at 23 °C of filling compounds
