IEC 60947-5-1:2016/COR1:2016 Corrigendum 1 - Low-voltage switchgear and controlgear - Part 5-1: Control circuit devices and switching elements - Electromechanical control circuit devices
€0.00
IEC 61347-2-3:2011/AMD1:2016 Amendment 1 - Lamp control gear - Part 2-3: Particular requirements for a.c. and/or d.c. supplied electronic control gear for fluorescent lamps
€12.00
IEC 62424:2016 Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
€551.00
IEC 61784-3-13:2016 Industrial communication networks - Profiles - Part 3-13: Functional safety fieldbuses - Additional specifications for CPF 13
IEC 62264-5:2016 Enterprise-control system integration - Part 5: Business to manufacturing transactions
IEC 61058-1:2016 Switches for appliances - Part 1: General requirements
€499.00
IEC 61347-2-13:2014/AMD1:2016 Amendment 1 - Lamp controlgear - Part 2-13: Particular requirements for d.c. or a.c. supplied electronic controlgear for LED modules
IEC 61784-3-18:2011/AMD1:2016 Amendment 1 - Industrial communication networks - Profiles - Part 3-18: Functional safety fieldbuses - Additional specifications for CPF 18
€23.00
IEC 61511-3:2016 Functional safety - Safety instrumented systems for the process industry sector - Part 3: Guidance for the determination of the required safety integrity levels
€470.00
IEC 60079-11:2011/ISH2:2016 Interpretation sheet 2 - Explosive atmospheres - Part 11: Equipment protection by intrinsic safety "i"
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IEC 60079-11:2011/ISH3:2016 Intrepretation sheet 3 - Explosive atmospheres - Part 11: Equipment protection by intrinsic safety "i"
IEC 60974-4:2016 Arc welding equipment - Part 4: Periodic inspection and testing
€133.00
IEC TS 62972:2016 General lighting - Organic light emitting diode (OLED) products and related equipment - Terms and definitions
€93.00
IEC TS 62332-3:2016 Electrical insulation systems (EIS) - Thermal evaluation of combined liquid and solid components - Part 3: Hermetic motor-compressors
€186.00
IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
