Test and Diagnosis for Electronic Systems

IEEE/IEC 62529:2024

IEEE/IEC 62529:2024

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IEEE/IEC International Standard for Signal and Test Definition

€201.00

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IEEE 1671.1-2017/Cor 1:2023

IEEE 1671.1-2017/Cor 1:2023

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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

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IEEE 1636.1-2018/Cor 1:2023

IEEE 1636.1-2018/Cor 1:2023

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) - Corrigenda 1

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IEEE 1641:2022

IEEE 1641:2022

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IEEE Standard for Signal and Test Definition

€200.00

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IEEE/IEC 61636:2021

IEEE/IEC 61636:2021

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IEC/IEEE International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€74.00

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IEEE/IEC 61636-1:2021

IEEE/IEC 61636-1:2021

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IEC/IEEE International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€63.00

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IEEE 1505.1:2019

IEEE 1505.1:2019

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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

€156.00

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IEEE 1636.2:2018

IEEE 1636.2:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

€56.00

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IEEE 1636.1:2018

IEEE 1636.1:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€65.00

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IEEE 1636:2018

IEEE 1636:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€65.00

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IEEE 1671.3:2017

IEEE 1671.3:2017

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IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

€155.00

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IEEE 1671.1:2017

IEEE 1671.1:2017

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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

€202.00

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IEEE 1871.2:2017

IEEE 1871.2:2017

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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

€55.00

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IEEE 1445:2016

IEEE 1445:2016

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IEEE Standard for Digital Test Interchange Format (DTIF)

€79.00

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IEEE/IEC 61671-2:2016

IEEE/IEC 61671-2:2016

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IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

€79.00

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