IEC 63364-1:2022 Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
€93.00
IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€46.00
IEC 61954:2021/COR1:2024 Corrigendum 1 - Static VAR compensators (SVC) - Testing of thyristor valves
This product is not for sale, please contact us for more information
IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
€14.00
IEEE Standard Letter Symbols for Semiconductor Devices
€51.00
IEEE Standard Definitions and Requirements for Thyristor AC Power Controllers
€49.00
IEEE Standard for Ferroresonant Voltage Regulators
€99.00
€122.00
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
€107.00
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
€95.00
IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays
€167.00
IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices
€147.00
IEEE Guide for the Application of Thyristor Surge Protective Devices
€123.00
