IEC 62047-4:2008 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
€133.00
IEC 60749-26:2025 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
€389.00
Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
€35.00
Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile
€24.00
BS EN IEC 62047-57 Micro-electromechanical systems Part 57: RF MEMS directional coupler
Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
€93.33
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
€76.00
