Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
€201.00
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
€329.00
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
€172.00
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test bias temperature instability
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability
€370.00
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
€390.00
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy
€191.00
Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor resistor (1T1R) resistive memory cells
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory
Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
€281.00
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
