BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor
€24.00
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system
€201.00
Graphical symbols for diagrams Semiconductors and electron tubes
€370.00
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
Cartridge fuses for voltages up to and including 1000 V a.c. 1500 d.c. Supplementary requirements fuse links the protection of semiconductor devices
€281.00
Specification. Impregnated-asbestos-covered copper conductors Round wire
Specification. Impregnated-asbestos-covered copper conductors Rectangular
Specification for dimensions of semiconductor devices and integrated electronic circuits
Mechanical standardization of semiconductor devices
