Amendments to the generic specification for semiconductor devices and integrated circuits; sampling requirements for small lots
€34.30
Electrical measuring methods for integrated circuits; chip select access time
Electrical measuring methods for integrated circuits; read access time
Electrical measuring methods for integrated circuits; write recovery time
Electrical measuring methods for integrated circuits; common-mode input voltage range
Electrical measuring methods for integrated circuits; short-circuit output current I
Electrical measuring methods for integrated circuits; channel separation, crosstalk (for multiple amplifiers)
Analogue circuits; amendments to the measuring methods for common-mode rejection ratio of integrated linear amplifiers (including operational amplifiers)
Semiconductor devices and integrated circuits; general principles of measuring methods revision of publication 147-2 (continued): voltage-reference and voltage-regulator diodes, varbiable-capacitance diodes
General principles of measuring methods; new measuring methods intended to be introduced in IEC publication 60147-2
€48.79
Harmonized system of quality assessment for electronic components; blank detail specification; fusible link programmable read only memories, silicon monolithic integrated circuits
€77.20
Electrical measuring methods for integrated circuits; supply voltage rejection ratio to a change of all supply voltages simultaneously
Film and hybrid integrated circuits; materials; methods for the asessment of conductive pastes (amendment 1)
Harmonized system of quality assessment for electronic components; family specification: digital integrated TTL-Low Power Schottky circuits; series 54 LS, 64 LS, 74 LS, 84 LS
Harmonized system of quality assessment for electronic components; generic specification: film and hybrid integrated circuits
€84.58
