31.200 : Integrated circuits. Microelectronics

ASTM F773M-10

ASTM F773M-10

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

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ASTM E1855-10

ASTM E1855-10

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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ASTM E1855-20

ASTM E1855-20

Active Most Recent

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

€65.00

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ASTM F744M-16

ASTM F744M-16

Withdrawn Most Recent

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

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ASTM F773M-16

ASTM F773M-16

Withdrawn Most Recent

Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)

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ASTM E1855-04e1

ASTM E1855-04e1

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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ASTM E1855-05

ASTM E1855-05

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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ASTM E1855-05e1

ASTM E1855-05e1

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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ASTM F1262M-95(2002)

ASTM F1262M-95(2002)

Superseded Historical

Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

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ASTM F773M-96(2003) (R1996)

ASTM F773M-96(2003) (R1996)

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

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ASTM F744M-97(2003) (R1997)

ASTM F744M-97(2003) (R1997)

Superseded Historical

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

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ASTM F1513-99(2003) (R1999)

ASTM F1513-99(2003) (R1999)

Superseded Historical

Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications

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ASTM E1855-04

ASTM E1855-04

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

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BS CECC 63100:1985

BS CECC 63100:1985

Active Most Recent

Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits

€201.00

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BS CECC 63101:1985

BS CECC 63101:1985

Active Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits

€201.00

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