Abstract General information
€49.00
Gas analysis — Preparation of calibration gas mixtures
€113.00
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
€204.00
Thiourea for industrial use
€75.00
Laboratory glassware Petri dishes
Sign up for email updates General information
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
€152.00
€254.00
