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18/30381548 DC:2018
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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Summary
Testing conditions;Semiconductors;Voltage measurement;Electronic equipment and components;Temperature;Transistors;Metal oxide semiconductors;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/03/2018 |
| Page Count | 17 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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