Superseded
Standard
Historical
ASTM E1855-96
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Summary
1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 12/10/1996 |
| Collection | |
| Page Count | 11 |
| Themes | Microelectron |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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