ASTM E2444-05e1
Superseded Standard
Historical

ASTM E2444-05e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films
Most recent standard

Summary

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

Technical characteristics

Publisher American Society for Testing and Materials (ASTM International)
Publication Date 05/01/2005
Collection
Page Count 3
Themes Mechanical structures for electronic equipment
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

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