Withdrawn , Confirmed Standard
Most Recent

ASTM F77-69(1996)

Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)

Summary

1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity.

1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use.

Technical characteristics

Publisher American Society for Testing and Materials (ASTM International)
Publication Date 01/01/1969
Confirmation Date 01/01/1996
Cancellation Date 05/10/2001
Collection
Page Count 2
Themes Ceramic products
EAN ---
ISBN ---
Weight (in grams) ---
No products.