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BS CECC 20000:1983
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
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Summary
Marking;Capacitance measurement;Optoelectronic devices;Couplers;Overvoltage tests;Wavelengths;Endurance testing;Optical measurement;Luminous intensity;Semiconductor devices;Radiometry;Light-emitting diodes;Light-emitting devices;Light distribution;Inspection;Surges (electrical);Electrical testing;Qualification approval;Testing conditions;Phototransistors;Quality assurance systems;Voltage measurement;Sampling methods;Electrical measurement;Solderability testing;Approval testing;Liquid crystal devices;Short-circuit current tests;Designations;Resistance measurement;Luminance;Radiant flux density;Circuits;Infrared radiation;Flashover;Assessed quality;Electronic equipment and components;Specification (approval);Bandwidths;Test equipment;Time measurement;Mechanical testing;Environmental testing;Thermal-cycling tests;Photodiodes;Performance testing;Current measurement;Orientation;Leak tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/1983 |
| Page Count | 100 |
| Themes | Leak tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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