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BS CECC 90000:Addendum No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection
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Summary
Defects;Particle size distribution;Assessed quality;Specification (approval);Passivation;Microscopic analysis;Circuits;Quality control;Approval testing;Metallizing;Monolithic integrated circuits;Surface defects;Qualification approval;Integrated circuits;Visual inspection (testing);Inspection;Quality assurance systems;Testing conditions;Electronic equipment and components
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/29/1983 |
| Page Count | 50 |
| Themes | Electronic equipment and components |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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