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BS CECC 90111:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits
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Summary
Monolithic integrated circuits;Metal oxide semiconductors;Qualification approval;Circuits;Integrated memory circuits;Quality control;Semiconductor devices;Approval testing;Silicon;Detail specification;Specification (approval);Assessed quality;Direct-access storage;Quality assurance systems;Electronic equipment and components;Computer storage devices;Electronic storage;Statistical quality control;Digital circuits;Semiconductor storage;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/15/1987 |
| Page Count | 18 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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