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BS EN 190000:1996
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
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Summary
Dimensions;Accelerated testing;Capability approval;Circuits;Defects;Solderability testing;Symbols;Assessed quality;Surface defects;Endurance testing;Specification (approval);Approval testing;Thermal testing;Electronic equipment and components;Quality control;Quality assurance systems;Marking;Test specimens;Vibration testing;Damp-heat tests;Environmental testing;Monolithic integrated circuits;Acceleration tests;Integrated circuits;Electrical testing;Formulae (mathematics);Testing conditions;Definitions;Visual inspection (testing);Impact testing;Inspection;Qualification approval;Detail specification;Orientation;Mechanical testing;Leak tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/15/1996 |
| Page Count | 206 |
| Themes | Leak tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
