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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
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Summary
Integrated circuits;Thermal testing;High-temperature testing;Reliability;Performance testing;Life (durability);Climate;Mechanical testing;Qualification approval;Endurance testing;Semiconductor devices;Environmental testing;Electronic equipment and components;Accelerated testing;Operating conditions
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2011 |
| Page Count | 12 |
| Themes | Operating conditions |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/06/2011
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