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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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Summary
Electrical measurement;Semiconductors;Dielectric breakdown;Life (durability);Testing conditions;Semiconductor devices;Films (states of matter)
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2011 |
| Page Count | 20 |
| Themes | Films (states of matter) |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/06/2011
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