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BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
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Summary
Semiconductor devices;Metal oxide semiconductors;Endurance testing;Electrical testing;Stress;Semiconductors;Transistors;Life (durability)
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/31/2010 |
| Page Count | 14 |
| Themes | Life (durability) |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/07/2010
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