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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
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Summary
Transistors;Metals;Semiconductor devices;Thermal testing;Ions;Semiconductors;Field-effect transistors;Migration (chemical);Electrical measurement;Oxides
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/30/2010 |
| Page Count | 12 |
| Themes | Oxides |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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