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BS EN 62418:2010
Semiconductor devices. Metallization stress void test
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Summary
Aluminium;Diffusion;Stress;Electrical measurement;Copper;Metals;Surfaces;Semiconductor devices;Electronic equipment and components;Visual inspection (testing);Semiconductors
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/31/2010 |
| Page Count | 20 |
| Themes | Semiconductors |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/08/2010
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