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BS EN 62435-5:2017
Electronic components. Long-term storage of electronic semiconductor devices Die and wafer
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Summary
Storage;Testing conditions;Semiconductor devices;Colour codes;Labels;Terminology;Symbols;Graphic symbols;Electrical measurement;Marking;Letters (symbols);Ratings;Identification methods;Electric terminals;Position;Electrical testing;Measurement;Electronic equipment and components;Integrated circuits;Endurance testing;Acceptance (approval);Electrostatics;Sensitivity;Reliability
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2017 |
| Page Count | 26 |
| Themes | Reliability |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/04/2017
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