BS IEC 60748-2:1997
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BS IEC 60748-2:1997

Semiconductor devices. Integrated circuits Digital integrated

Summary

Semiconductor devices;Integrated memory circuits;Integrated logic circuits;Combinational circuits;Integrated circuits;Electrical components;Electrical properties and phenomena;Electronic equipment and components;Read-only storage;Definitions;Electrical equipment;Ratings;Microprocessor chips;Letters (symbols);Performance testing;Symbols;Electrical measurement;Electrical testing;Acceptance (approval);Sequential circuits;Endurance testing;Circuits;Digital integrated circuits;Test equipment;Reliability

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 04/15/1998
Page Count 178
Themes Reliability
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