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BS IEC 62526:2007
Standard for extensions to standard test interface language (STIL) for semiconductor design environments
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Summary
Information exchange;Automatic;Data transfer;Test equipment;Data representation;Interfaces (data processing);Computer applications;Simulation;Data processing;Programming languages;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 12/31/2007 |
| Page Count | 124 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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