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BS IEC 62528:2007
Standard testability method for embedded core-based integrated circuits
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Summary
Testing;Electronic engineering;Computer circuits;Microprocessor chips;Electronic equipment and components;Computer hardware;Integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 12/31/2007 |
| Page Count | 126 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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31/12/2007
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