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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
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Summary
Spectroscopy;Dimensional measurement;Resolution;Photoelectron spectroscopy;Side;Electron emission;Surfaces;Straight;Surface chemistry;Chemical analysis and testing;X-ray photoelectron spectroscopy;Auger electron spectroscopy;Electron physics
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/30/2006 |
| Page Count | 34 |
| Themes | Electron physics |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/11/2006
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