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BS ISO 21222:2020
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Summary
Surfaces;Analysis;Probes;Elastic moduli;Microscopes
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 02/07/2020 |
| Page Count | 26 |
| Themes | Microscopes |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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