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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
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Summary
Surfaces;Chemical analysis and testing;Definitions;Vocabulary;Surface properties;Spectroscopy
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 05/14/2019 |
| Page Count | 38 |
| Themes | Spectroscopy |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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