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DD ENV 50219:1996
Description of the reliability test structures of the European mini test chip
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/15/1996 |
| Cancellation Date | 04/20/2012 |
| Page Count | 38 |
| Themes | Microprocessor chips |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
15/09/1996
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