DD IEC/TS 62215-2:2007
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DD IEC/TS 62215-2:2007

Integrated circuits. Measurement of impulse immunity Synchronous transient injection method

Summary

Integrated circuits;Electrical measurement;Impulse voltages;Transient voltages;Electromagnetic compatibility;Electronic equipment and components;Semiconductors;Impulse-voltage tests;Test equipment

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 11/30/2007
Page Count 28
Themes Test equipment
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ISBN ---
Weight (in grams) ---
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