DIN 41792 Beiblatt 1:1971-09

Superseded Standard amendment

Historical

DIN 41792 Beiblatt 1:1971-09

Semiconductor devices for telecommunication; measuring methods, transistors

Most recent standard

Description

Features

Life cycle

Historical

No description.

Technical characteristics

Publisher	Deutsche Institut für Normung e.V. (DIN)
Publication Date	09/01/1971
Page Count	8
EAN	---
ISBN	---
Weight (in grams)	---

No products.

Previous versions

DIN 41792 Beiblatt 5:1976-03

DIN 41792 Beiblatt 5:1976-03

Low power semiconductor devices; measuring methods, mixer diodes used at microwave frequencies

01/03/1976

Withdrawn

Most Recent

DIN 41792 Beiblatt 4:1972-10

DIN 41792 Beiblatt 4:1972-10

Low power semiconductor devices; measuring methods, voltage reference and regulator diodes

01/10/1972

Withdrawn

Most Recent

DIN 41792 Beiblatt 1:1971-09

DIN 41792 Beiblatt 1:1971-09

Semiconductor devices for telecommunication; measuring methods, transistors

01/09/1971

Superseded

Historical

DIN 41792 Beiblatt 3:1968-07

DIN 41792 Beiblatt 3:1968-07

Low-power semiconductor devices measuring methods; thermal resistance

01/07/1968

Superseded

Historical

DIN 41792:1965-08

DIN 41792:1965-08

Semiconductor devices for telecommunication; general principles of measuring methods, precautions

01/08/1965

Superseded

Historical

Language

Format

Redline

Without Redline

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