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DIN 45940-1132*CECC 90112:1989-02
Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/wirte dynamic memories silicon monolithic circuits
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 02/01/1989 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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