DIN 50431:1988-05
Withdrawn Standard
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DIN 50431:1988-05

Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 05/01/1988
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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