DIN 50438-1:1995-07
Withdrawn Standard
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DIN 50438-1:1995-07

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 07/01/1995
Page Count 8
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ISBN ---
Weight (in grams) ---
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