Superseded
Draft standard
Historical
DIN 50440-1:1994-04
Testing of materials for semiconductor technology; measurement of carrier lifetime in silicon single crystals; recombination carrier lifetime at low injection by photo conductive decay method
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/1994 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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